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| LEADER |
03327ntm a22008177a 4500 |
| 001 |
MUB01000345585 |
| 003 |
CZ BrMU |
| 005 |
20190805124428.0 |
| 008 |
020725s2002 xr ||||| |||||||||||cze|d |
| STA |
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|a POSLANO DO SKCR
|b 2010-01-21
|
| 040 |
|
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|a BOD004
|b cze
|
| 072 |
|
7 |
|a 539
|x Fyzikální stavba hmoty. Jaderná fyzika. Molekulární fyzika
|2 Konspekt
|9 6
|
| 080 |
|
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|a (043)378.2
|2 MRF
|
| 080 |
|
|
|a 539.216
|2 MRF
|
| 080 |
|
|
|a 538.958
|2 MRF
|
| 080 |
|
|
|a 531.715:543.421/.424
|2 MRF
|
| 100 |
1 |
|
|a Omasta, Jaroslav
|* [absolvent PřírF MU]
|4 dis
|
| 245 |
1 |
0 |
|a Charakterizace tenkých vrstev chalkogenidů pomocí optických metod a AFM
|h [rukopis] /
|c Jaroslav Omasta.
|
| 260 |
|
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|c 2002.
|
| 300 |
|
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|a 72 l.
|
| 500 |
|
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|a Vedoucí práce: Ivan Ohlídal.
|
| 502 |
|
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|a Diplomová práce--Masarykova univerzita v Brně, Přírodovědecká fakulta, 2002.
|
| 650 |
0 |
7 |
|a optické vlastnosti materiálů
|7 ph316259
|2 czenas
|
| 650 |
0 |
7 |
|a spektroskopická elipsometrie
|7 ph543018
|2 czenas
|
| 650 |
0 |
7 |
|a tenké vrstvy
|7 ph126536
|2 czenas
|
| 650 |
0 |
9 |
|a optical properties of materials
|2 eczenas
|
| 650 |
0 |
9 |
|a spectroscopic ellipsometry
|2 eczenas
|
| 650 |
0 |
9 |
|a thin films
|2 eczenas
|
| 655 |
|
7 |
|a diplomové práce
|7 fd132022
|2 czenas
|
| 655 |
|
9 |
|a master's theses
|2 eczenas
|
| 700 |
1 |
|
|a Ohlídal, Ivan,
|d 1945-
|7 ola200208057
|% UČO 2397
|4 ths
|
| 856 |
4 |
1 |
|z Elektronická verze přístupná pouze pro studenty a pracovníky MU
|u https://is.muni.cz/auth/th/12419/prif_m/
|% s9917
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|1 PRIF
|a Přírodovědecká fakulta
|2 PRFSK
|b ÚK sklad
|3 K-9321
|5 3145313645
|8 20041229
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|a SCI50
|b PRIF
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|d K-9321
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|f 1
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