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20130819135805.0 |
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980429s1969 xxu||||| |||||||||||eng|d |
| STA |
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|a POSLANO DO SKCR
|b 2010-02-24
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| 040 |
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|a BOD004
|b cze
|d BOD004
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| 072 |
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7 |
|a 53
|x Fyzika
|2 Konspekt
|9 6
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| 080 |
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|a 53.08
|2 MRF
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| 080 |
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|a 539.216
|2 MRF
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|a 53
|2 MRF
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| 245 |
0 |
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|a Physical measurement and analysis of thin films /
|c edited by E.M. Murt, W.G. Guldner.
|
| 260 |
|
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|a New York :
|b Plenum Press,
|c 1969.
|
| 300 |
|
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|a xi, 194 s.
|
| 490 |
1 |
|
|a Progress in analytical chemistry ;
|v vol. 2
|
| 650 |
0 |
7 |
|a fyzikální měření
|7 ph120439
|2 czenas
|
| 650 |
0 |
7 |
|a tenké vrstvy
|7 ph126536
|2 czenas
|
| 650 |
0 |
9 |
|a physical measurements
|2 eczenas
|
| 650 |
0 |
9 |
|a physical measurement
|2 eczenas
|
| 650 |
0 |
9 |
|a thin films
|2 eczenas
|
| 655 |
|
7 |
|a monografie
|7 fd132842
|2 czenas
|
| 700 |
1 |
|
|a Murt, E. M.
|4 edt
|
| 700 |
1 |
|
|a Guldner, W. G.
|4 edt
|
| 830 |
|
0 |
|a Progress in analytical chemistry ;
|v vol. 2
|
| CAT |
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|a CONV-PRIF
|b 02
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| LOW |
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|a POSLANO DO SKCR
|b 2010-02-24
|
| 994 |
- |
1 |
|l MUB01
|l MUB01
|m BOOK
|1 PRIF
|a Přírodovědecká fakulta
|2 PRFST
|b ÚK volný výběr
|3 538.97-PHYS
|6 21-177-73
|5 3145017043
|4 DPČ: 39/73
|8 20041229
|f 74
|f Měsíční
|q 20180717
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| 994 |
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1 |
|l MUB01
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|a Přírodovědecká fakulta
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|b ÚK volný výběr
|3 A-3974
|6 21-1686-71
|5 3145016998
|4 DPČ: 204/71
|8 20041229
|f 77
|f Dlouhodobá
|q 20190207
|r 20061011
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| AVA |
|
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|a SCI50
|b PRIF
|c ÚK volný výběr
|d 538.97-PHYS
|e available
|t K dispozici
|f 2
|g 1
|h N
|i 2
|j PRFST
|
