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20210827123511.0 |
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110603s2007 xxk||||| |||||||||||eng d |
| STA |
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|a POSLANO DO SKCR
|b 2019-11-27
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| 020 |
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|a 978-0-470-01608-4
|z 0470016086
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|a BOD004
|b cze
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|a 538.958
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| 080 |
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|a (048.8)
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| 100 |
1 |
|
|a Fujiwara, Hiroyuki
|7 xx0263426
|4 aut
|
| 245 |
1 |
0 |
|a Spectroscopic ellipsometry :
|b principles and applications /
|c Hiroyuki Fujiwara
|
| 260 |
|
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|a Chichester :
|b John Wiley & Sons,
|c c2007
|
| 300 |
|
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|a xviii, 369 s.
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| 650 |
0 |
7 |
|a optické vlastnosti materiálů
|7 ph316259
|2 czenas
|
| 650 |
0 |
7 |
|a spektroskopická elipsometrie
|7 ph543018
|2 czenas
|
| 650 |
0 |
9 |
|a optical properties of materials
|2 eczenas
|
| 650 |
0 |
9 |
|a spectroscopic ellipsometry
|2 eczenas
|
| 655 |
|
7 |
|a monografie
|7 fd132842
|2 czenas
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| 655 |
|
9 |
|a monographs
|2 eczenas
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