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MUB01000345586 |
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030825s2003 xr ||||| |||||||||||cze|d |
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|a POSLANO DO SKCR
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|a BOD004
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|a 539
|x Fyzikální stavba hmoty. Jaderná fyzika. Molekulární fyzika
|2 Konspekt
|9 6
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| 080 |
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|a 539.216
|2 MRF
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| 080 |
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|a 537.311.322
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| 080 |
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| 080 |
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|a (043)378.2
|2 MRF
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| 100 |
1 |
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|a Šiler, Martin
|4 dis
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| 245 |
1 |
0 |
|a Charakterizace tenkých vrstev polovodičů A2B6 pomocí spektroskopické elipsometrie, spektroskopické reflektometrie a mikroskopie atomové síly
|h [rukopis] /
|c Martin Šiler.
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| 260 |
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|c 2003.
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| 300 |
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|a 70 s.
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| 500 |
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|a V názvu je použit vzorec.
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| 502 |
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|a Diplomová práce--Přírodovědecké fakulta MU, 2003.
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| 650 |
0 |
7 |
|a optické vlastnosti materiálů
|7 ph316259
|2 czenas
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| 650 |
0 |
7 |
|a optoelektronika
|7 ph123773
|2 czenas
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| 650 |
0 |
7 |
|a polovodiče
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| 650 |
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7 |
|a tenké vrstvy
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| 650 |
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|a optical properties of materials
|2 eczenas
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| 650 |
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9 |
|a optoelectronics
|2 eczenas
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| 650 |
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9 |
|a semiconductors
|2 eczenas
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| 650 |
0 |
9 |
|a thin films
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| 655 |
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|a diplomové práce
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| 655 |
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|a master's theses
|2 eczenas
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| 710 |
2 |
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|a Masarykova univerzita.
|b Katedra fyzikální elektroniky
|7 olak2007365930
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