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genre_facet:"papers of several authors"
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language:"Czech"
topic_facet:"ellipsometry"
topic_facet:"fyzika"
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Interpolační metoda pro určení technických parametrů z elipsometrických měření ; Metody stanovení optických konstant z intenzity odraženého světla ; Using rotoreflection for the measurement of the optical properties of germanium and silicon ; The optimization of ellipsometric measurements /
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Schmidt, Eduard, 1935-2021
Published 1969
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Genre: papers of several authors
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Genre: sborníky
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Language: Czech
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Suggested Topics: ellipsometry
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Suggested Topics: fyzika
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Janča, Jan, 1938-
1
Lukeš, František, 1931-
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Schmidt, Eduard, 1935-2021
1
Stejskalová, Vlaďka, 1943-
1
Language
Czech
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Fyzika
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electronics
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elektronika
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elipsometrie
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elipsometry
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ellipsometry
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fyzika
interpolační metoda
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papers of several authors
sborníky
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