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|a EIZ
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|c EBSCO trvale nakupy
|d 2018-07-31
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| 010 |
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|a 2014017866
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|a 9781118916773
|q (epub)
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|a 9781118916780
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| 035 |
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|a (OCoLC)ocn879329842
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|a (OCoLC)879329842
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|z (OCoLC)961536162
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|a 543
|x Analytická chemie
|2 Konspekt
|9 10
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| 080 |
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|a 543.51
|2 MRF
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| 080 |
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|a 54-128
|2 MRF
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| 100 |
1 |
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|a Van der Heide, Paul,
|d 1962-
|4 aut
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| 245 |
1 |
0 |
|a Secondary ion mass spectrometry :
|b an introduction to principles and practices /
|c Paul van der Heide
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| 264 |
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1 |
|a Hoboken, New Jersey :
|b Wiley,
|c [2014]
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| 264 |
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4 |
|c ©2014
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| 300 |
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|a 1 online zdroj (xvii, 365 stran) :
|b ilustrace
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a počítač
|b c
|2 rdamedia
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| 338 |
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|a online zdroj
|b cr
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0 |
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|a Chapter 1. Introduction: 1.1 Matter and the Mass Spectrometer ; 1.2 Secondary Ion Mass Spectrometry ; 1.3 Summary -- Chapter 2. Properties of atoms, ions, molecules and solids: 2.1 The Atom ; 2.2 Electronic structure of atoms and ions -- Chapter 3. Current understanding of sputtering and ion formation: 3.1 The fundamentals of SIMS ; 3.2 Sputtering ; 3.3 Ionization/neutralization ; 3.4 Summary -- Chapter 4. Instrumentation: 4.1 The science of measurement ; 4.2 Hardware -- Chapter 5. Data collection: 5.1 The art of measurement ; 5.2 Sample preparation and handling ; 5.3 Data collection ; 5.4 Data conversion -- Appendix i) Periodic table of the elements ; ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements ; iii) 1st and 2nd Ionization potentials and electron affinities of the elements ; iv) Work-functions of elemental solids ; v) SIMS detection limits of selected elements ; vi) Charged particle beam transport ; vii) Statistical properties ; viii) SIMS instrument designs ; ix) Additional SIMS methods of interest ; x) Additional spectrometric/spectroscopic techniques ; xi) Additional microscopic techniques ; xii) Diffraction / reflection techniques -- Technique acronym list -- Abbreviations commonly used in SIMS.
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| 533 |
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|a Elektronická reprodukce.
|n Přístup pouze pro oprávněné uživatele
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| 650 |
0 |
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|a hmotnostní spektrometrie
|7 ph120763
|2 czenas
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| 650 |
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|a ionty
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| 650 |
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|a mass spectroscopy
|2 eczenas
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|a ions
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|a e-books online
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| 776 |
0 |
8 |
|i Tištěná verze:
|t Secondary ion mass spectrometry.
|z 978-1-118-48048-9
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| 856 |
4 |
1 |
|z Elektronická verze přístupná pouze pro studenty a pracovníky MU
|u https://ezproxy.muni.cz/login?url=https://search.ebscohost.com/login.aspx?authtype=ip&custid=s8431878&lang=cs&profile=eds&direct=true&db=nlebk&AN=834736
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