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101013s1975 xxu||||| |||||||||||eng d |
| STA |
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|a POSLANO DO SKCR
|b 2019-09-10
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| 020 |
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|a 0-306-30820-7
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| 040 |
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|a BOD002
|b cze
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| 072 |
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7 |
|a 681
|x Přesná mechanika a přístroje
|2 Konspekt
|9 19
|
| 080 |
|
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|a 681.723
|2 MRF
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| 080 |
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|a 681
|2 MRF
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| 245 |
0 |
0 |
|a Practical scanning electron microscopy :
|b electron and ion microprobe analysis /
|c edited by Joseph I.Goldstein and Harvey Yakowitz
|
| 250 |
|
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|a [1st ed.]
|
| 260 |
|
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|a New York :
|b Plenum Press,
|c 1975
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| 300 |
|
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|a xviii, 582 s. :
|b obr.
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| 504 |
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|a Obsahuje bibliografii a věcný rejstřík
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| 650 |
0 |
7 |
|a mikroskopy
|7 ph263229
|2 czenas
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| 650 |
0 |
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|a microscopes
|2 eczenas
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| 655 |
|
7 |
|a monografie
|7 fd132842
|2 czenas
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| 655 |
|
9 |
|a monographs
|2 eczenas
|
| 700 |
1 |
|
|a Goldstein, Joseph,
|d 1939-
|7 stk2008428873
|4 edt
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| 700 |
1 |
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|a Yakowitz, Harvey
|4 edt
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